High resolution TEM (FIG. 3C) shows continuous lattice fringes in the onion structure, which correspond to graphitic planes. The corresponding selected area electron diffraction (SAED) pattern is shown in FIG. 3D. The lattice spacing measured from structures in 3 different samples is found to be 0.340.+-.0.005 nm, which corresponds to lattice planes in graphite. The three-dimensional nested structure of nano-onions can be seen in the SEM image (FIG. 3E) of a broken onion.
FIG. 3C is a high-resolution TEM image showing lattice fringes, which match the lattice planes in graphite; FIG. 3D is a Selected Area Electron Diffraction (SAED) pattern with inner ring corresponding to the reflection in graphite; FIG. 3E is a Scanning Electron Microscope (SEM) image showing the internal layer structure of a broken nano-onion; FIG. 4A is a TEM image of material deposited in 2 Torr Ar; FIG. 4B is a SAED pattern corresponding to FIG. 4A.
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